Ion Beam Analysis : Rutherford Back Scattering (RBS) / Channeling, Nuclear Reaction Analysis (NRA), Elastic Recoil Detection Analysis (ERDA)
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Rutherford Back Scattering (RBS) is an excellent tool for studying thin films, interfaces, diffusion phenomena. Channeling is used for detection of interstitial defects and strain analysis. NRA is used for quantitative depth profiles of low Z materials, isotopic tracing. ERDA is used for simultaneous quantitative depth profiles for all elements in the periodic table. |
Ion Beam Synthesis of Nanostructured Materials
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Supersaturation of implanted ion in an immiscible matrix occurs due to its low solubility. Concentration fluctuation nucleates atomic species and these nuclei can grow directly from the supersaturation. With increasing fluence, agglomeration to bigger clusters is likely. |
Surface patterning by Ion Beam Sputtering
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Self organized patterns like ripples and dots appear on the surface under certain conditions during irradiation. These surface patterns are result of interplay between roughening process caused by ion beam sputtering and smoothening process caused by surface diffusion. By selecting the appropriate irradiation parameters, surface patterns with various wavelength can be achieved. |
Ion Beam Mixing
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Upon irradiation, an atomic intermixing of the different layers takes place leading to the precipitation of an immiscible element with optimum grain-size distribution. The precipitation is influenced by the atomic rearrangement of the matrix by the diffusion process and the relative chemical affinities among the elements involved. |
Trace Elemental Analysis using PIXE
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PIXE is one of the most sensitive (ppm) non-destructive technique for multi-elemental compositional analysis. Suitable for biological and archeological samples. |