We specialize in the growth of nanomaterials in the reduced dimension for Structural, and Surface (Electrical, Magnetic and Acoustic) Characterizations. This group also specialized in gas phase surface modification by over-layer growth (carbide, nitride and carbo-nitrides) by controlled atmosphere exposure and sub-surface ion implantation (PIII).

Chemical routes for 0-D Nanoclusters, Catalyst based Vapor-Liquid-Solid (VLS) growth of 1-D nanostructures and Plasma Enhanced CVD based DLC films and aligned CNT – doping and sub-surface modification by Plasma immersion Ion Implantation techniques are adopted

    SNOM based nano-Raman scattering is used for structural characterization. Shear force topography and mapping are also used in this technique.

    SPM based Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Spreading Resistance Imaging (SRI), Electric Force Microscopy (EFM), Atomic Force Acoustic Microscopy (AFAM) are used for detailed surface characterizations.